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Table 4 Volume percentage of elements originally present on the untreated surface and elements which appear after instrumentation

From: Assessment of implant surface and instrument insert changes due to instrumentation with different tips for ultrasonic-driven debridement

(n = 5 spots/disc and tip)

Ti

Zr

O

C

fe %

te

Disc I

 0

88.0 ± 13.6

0

5.4 ± 4.8

6.1 ± 8.5

Al 9.9

Ca, Si

 A

83.0 ± 16.2

0

6.4 ± 2.1

1.5 ± 0.2

Fe 39.1, Cr 5.4

-

 B

80.7 ± 18.3

0

9.3 ± 5.1

9.6 ± 15.3

-

Al, Ca, Si, Fe

 C

86.1 ± 8.6

0

10.5 ± 5.8

3.1 ± 2.6

-

Si, Ca

 D

78.1 ± 24.0

0

18.1 ± 20.5

12.0 ± 18.3

S 8, Ca 3

-

 E

63.1 ± 31.7

0

7.2 ± 4.3

27.7 ± 26.5

S 6

Ca

Disc II

 0

73.3 ± 11.5

12.9 ± 2.9

9.2 ± 9.2

8.7 ± 11.1

-

S, Ca

 A

56.5 ± 6.6

12.6 ± 0.4

8.3 ± 5.2

1.9 ± 0.7

-

-

 B

71.0 ± 15.8

12.1 ± 3.3

8.1 ± 6.3

8.3 ± 11.7

-

Ca, Al, S, Na, Si

 C

78.2 ± 4.5

13.3 ± 0.7

6.8 ± 3.7

1.7 ± 0.9

-

-

 D

62.3 ± 30.9

10.9 ± 5.5

6.2 ± 2.0

14.6 ± 24.2

-

-

 E

38.1 ± 35.7

6.9 ± 6.6

6.2 ± 4.9

44.2 ± 33.6

S 14.0

Si, Ca

Disc III

 0

74.7 ± 16.7

0

16.5 ± 9.5

2.7 ± 1.5

Al 27

Ca, Si

 A

84.6 ± 9.9

0

9.0 ± 4.0

1.9 ± 0.7

Fe 9.8, Al 10.3, Cr 1.5

-

 B

73.7 ± 19.2

0

10.8 ± 4.6

12.6 ± 15.2

Al 9.5

Ca, Si

 C

88.5 ± 5.1

0

8.8 ± 4.0

1.9 ± 0.5

Al 5.7,

Si

 D

58.1 ± 17.7

0

19.4 ± 10.3

12.8 ± 15.9

S 13, Ca 12, Al 5, Si 2.0

-

 E

44.2 ± 35.4

0

17.9 ± 10.5

21.4 ± 23.3

Al 51, S 6

Ca, Na, Si

Disc IV

 0

77.7 ± 2.7

13.9 ± 1.9

7.1 ± 10.2

3.3 ± 1.4

-

-

 A

78.8 ± 5.3

12.3 ± 2.2

6.0 ± 3.7

1.7 ± 1.6

Fe 3.2

-

 B

79.4 ± 2.2

12.9 ± 0.8

5.4 ± 2.1

2.3 ± 0.5

-

-

 C

77.0 ± 4.9

14.5 ± 2.8

5.2 ± 1.7

3.1 ± 1.6

-

Fe, Ca

 D

77.4 ± 3.5

12.9 ± 1.2

7.3 ± 3.3

2.4 ± 1.0

-

-

 E

73.0 ± 13.4

35.0 ± 44.2

3.9 ± 0.5

7.6 ± 9.7

-

Ca, S, B

  1. Disc I—Inicell, Disc II—SLA, Disc III—non pretreated, Disc IV—machined
  2. 0—non instrumented surface, A—steel, B—PEEK, C—titanium, D—Carbon, E—resin
  3. Ti—Titanium, Zr—zirconium, O—oxygen, C—carbon, fe—foreign metals > 1.0%, te—traces of foreign elements